Abstract: The Electro-Static Discharge (ESD) protection design and verification methodology are particularly important for the Wafer on Wafer (WoW) stacked system due to the miniaturization of ...
Abstract: Technology scaling and increased data rates make it near impossible to achieve historic levels of electrostatic discharge (ESD) robustness. This heightens the need for pre-Si verification ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback