A study published in Molecules and led by researchers from the Changchun Institute of Optics, Fine Mechanics and Physics (CIOMP) of the Chinese Academy of Sciences demonstrated how deep learning can ...
A fine-tuned VGG16 network achieved 84.0 percent subset accuracy and an 85.2 percent micro-averaged F1-score on a held-out ...
Uncover the latest and most impactful research in Automated Weld Defect Detection Using Deep Learning. Explore pioneering discoveries, insightful ideas and new methods from leading researchers in the ...
A new review describes how AI-based imaging and sensing technologies can detect packaging film defects that traditional meat ...
At Fruit Attraction 2026, TOMRA Food will present its blueberry optical grader designed for one of the fastest-growing segments in the horticultural industry. "From infeed through to discharge, the ...
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...
Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...
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