A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...

In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...

Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology. (Nanowerk News) Materials scientists at the ...

As the field moves quickly, engineers and researchers are under pressure to keep up with new materials, new deposition techniques, and increasingly refined methods for measuring and evaluating it all.

How can high-current contacts be reliably monitored? The Fraunhofer Institute for Surface Engineering and Thin Films IST will demonstrate a solution to this question from June 9 to 11, 2026, at ...

The Fraunhofer Institute for Surface Engineering and Thin Films IST makes exactly these hidden conditions visible: with integrated thin-film sensor technology that measures directly on the component ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...

Definition: Thin films are critical layers of material, from a few nanometers to several micrometers thick, deployed across technology, electronics, and energy sectors. Their importance lies in their ...

This eBook presents a collection of expert-written articles and news stories that cover the latest advancements in thin-film technology, along with insights into the critical role of metrology in ...