A first-of-its-kind test shows that reusing energy within a computer chip can work, thanks to two techy tricks.

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power ...