CRAIC Technologies, the global leader in UV-Visible-NIR microspectroscopy, today announced significant technology updates to the 508PV ™ Microscope Spectrophotometer, designed to meet the precision ...

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...

The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers ...

The SMAL lens enables super-resolution imaging for semiconductors with clear resolution of features down to tens of ...

This article describes a six-inch wafer inspection microscope that provides automated, reproducible differential interference contrast (DIC) imaging, regardless of the user’s skill level. Wafer ...

(Nanowerk News) PI (Physik Instrumente), a global leader in nanopositioning motion control for life sciences, semiconductor, and photonics, offers a series of piezo-flexure controlled nanopositioning ...

This article explores LIG’s SMAL lenses, including their design principles, manufacturing methods, and performance in ...

An ultra-high vacuum scanning tunnel microscope — or UHV STM — has been donated to Miami University through an educational partnership agreement with the Materials and Manufacturing Division of the ...

Researchers from the University of California Santa Barbara have visualized photoexcited charges traveling across the interface of two different semiconductor materials within a solar cell. In a solar ...