Dimensional metrology using scanning probe microscopy (SPM) refers to the precise measurement of three‐dimensional features at the micro‐ and nanoscale by raster-scanning a sharp probe across a ...

Surface catalysis harnesses the unique reactivity of solid interfaces to accelerate chemical transformations essential for industrial processes, energy conversion and environmental protection.

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

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All matter is made of very small units called atoms. Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

Mervyn John Miles, Emeritus Professor of Physics, passed away on May 8, 2026. A truly remarkable interdisciplinary scientist, ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...