Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

WILSONVILLE, Ore., Oct. 29, 2018 /PRNewswire/ -- Mentor, a Siemens business, today announced the availability of automotive-grade automatic test pattern generation (ATPG) technology for its Tessent™ ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer Guettaf ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

With regards to the ongoing trend of diminishing transistor geometries, we are witnessing a sharp increase in defect density along with significant on-chip process variations that affect transistor ...